We are excited to introduce our latest addition: a next generation scanning electron microscope (SEM) equipped with an EDX analyzer for precise chemical element detection.
With this cutting-edge technology, we are enhancing our capabilities in material analysis and defect investigation across multiple applications, based on the needs of our industrial partners. Here are some key areas of expertise:
Material Analysis and Identification
Confirming the presence of specific fibers or the chemical composition of fillers in polymers is now possible with high precision. Cross-sectional and longitudinal imaging enables visual and chemical identification of materials, facilitating the evaluation of fiber dispersion in blended yarns, for example.
